
INSTRUMENTS Whether an application requires static or dynamic real time acquisition or periodic monitoring, Micron Optics offers the right instrument for the job. Micron Optics' robust, turn-key interrogators provide fast and accurate readings of as many as hundreds of Fiber-Bragg Gratings or Extrinsic Fabry-Perot sensors.
Proven to be an essential element in reliable, long-term sensing measurement installations, Micron Optics sensing instruments have been installed in hundreds of challenging applications all over the world, including large-span bridges in China, earthquake monitors in California, oil platforms in Brunei, and marine vessels in the North Sea.
| INSTRUMENTS |
x25 |
x30 |
| Field Modules | ||
| Rack Mount Modules |
sm225 |
sm230 |
| Rack Mount Instruments |
si225 |
si230 |
| Laboratory Instruments |
si725 |
si730 |
| Research Instrument |
si920* |
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| ACCESSORIES |
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| Expansion Module | ||
| Processing Modules |
for the sm125 |
for the sm130 |
| sp125 | sp130 | |
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and other Micron Optics product designations.
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Static full spectrum optical interrogators measure the full optical spectrum of the optical sensor signals and can be equipped with a NIST Absolute Reference Cell. The performance of the static interrogator module is characterized by high dynamic range and high absolute wavelength accuracy.
Dynamic optical interrogators primarily measure the peak wavelength of optical sensor signals, allowing for higher acquisition rates than their static interrogator counterparts. The performance of the dynamic interrogator module is characterized by high data acquisition rates, sensitivity and repeatability.
Please contact Micron Optics for additional product information.
- Product Update
February 12, 2010 -- ENLIGHT v1.0 now available. Go to the Software page and click on the ENLIGHT button to download the new software - Press Release
September 29, 2009 -- Micron Optics Announces os7100 optical accelerometer - Upcoming Event
SEM Annual Conference & Exposition
June 7-10, 2010
Indianapolis, IN, USA - Upcoming Event
APOS 2010
June 28-30, 2010
Guangzho, China




